Dr. Xiangyan Zhang | wafer defect detection | Best Researcher Award
Dr. Beijing University of Posts and Telecommunications , China
Academic and Professional Background 📚👩🎓
In June 2023, I was awarded a Master of Engineering degree from Beijing University of Science and Technology, and in September 2023, I commenced my Ph.D. studies at Beijing University of Posts and Telecommunications. To date, I have published 4 SCI papers, 2 EI conference papers, granted 2 invention patents, and obtained 3 software copyrights.
Research and Innovations 🔬💡
Completed/Ongoing Research Projects 🚀Vision-based robotic grasp detection projectWafer defect detection project
Citation Index 📑
Zhang, X., Jiang, Z., Yang, H., Mo, Y., Zhou, L., Zhang, Y., Li, J., Wei, S. (2024). DMWMNet: A novel dual-branch multi-level convolutional network for high-performance mixed-type wafer map defect detection in semiconductor manufacturing. Computers in Industry, 161, 104136